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MLA
Yuan, Kun, and Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. RAND Corporation, 2014, www.jstor.org/stable/10.7249/j.ctt5vjvq3, Accessed 25 July 2021.
APA
Yuan, K., & Le, V. (2014). Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. SANTA MONICA, CA; WASHINGTON, DC; PITTSBURGH, PA; NEW ORLEANS, LA; JACKSON, MS; BOSTON, MA; CAMBRIDGE, UK; BRUSSELS, BE: RAND Corporation. Retrieved July 25, 2021, from http://www.jstor.org/stable/10.7249/j.ctt5vjvq3
CHICAGO
Yuan, Kun, and Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. SANTA MONICA, CA; WASHINGTON, DC; PITTSBURGH, PA; NEW ORLEANS, LA; JACKSON, MS; BOSTON, MA; CAMBRIDGE, UK; BRUSSELS, BE: RAND Corporation, 2014. Accessed July 25, 2021. http://www.jstor.org/stable/10.7249/j.ctt5vjvq3.

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