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MLA
“Tests Included in This Study.” Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams, by Kun Yuan and Vi-Nhuan Le, RAND Corporation, SANTA MONICA, CA; WASHINGTON, DC; PITTSBURGH, PA; NEW ORLEANS, LA; JACKSON, MS; BOSTON, MA; CAMBRIDGE, UK; BRUSSELS, BE, 2014, pp. 9–18, www.jstor.org/stable/10.7249/j.ctt5vjvq3.10. Accessed 26 July 2021.
APA
Yuan, K., & Le, V. (2014). Tests Included in This Study. In Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams (pp. 9-18). SANTA MONICA, CA; WASHINGTON, DC; PITTSBURGH, PA; NEW ORLEANS, LA; JACKSON, MS; BOSTON, MA; CAMBRIDGE, UK; BRUSSELS, BE: RAND Corporation. Retrieved July 26, 2021, from http://www.jstor.org/stable/10.7249/j.ctt5vjvq3.10
CHICAGO
Yuan, Kun, and Vi-Nhuan Le. "Tests Included in This Study." In Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams, 9-18. SANTA MONICA, CA; WASHINGTON, DC; PITTSBURGH, PA; NEW ORLEANS, LA; JACKSON, MS; BOSTON, MA; CAMBRIDGE, UK; BRUSSELS, BE: RAND Corporation, 2014. Accessed July 26, 2021. http://www.jstor.org/stable/10.7249/j.ctt5vjvq3.10.

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