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MLA
“Summary.” Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams, by Kun Yuan and Vi-Nhuan Le, RAND Corporation, SANTA MONICA, CA; WASHINGTON, DC; PITTSBURGH, PA; NEW ORLEANS, LA; JACKSON, MS; BOSTON, MA; CAMBRIDGE, UK; BRUSSELS, BE, 2014, pp. xi-xviii, www.jstor.org/stable/10.7249/j.ctt5vjvq3.6. Accessed 2 Aug. 2021.
APA
Yuan, K., & Le, V. (2014). Summary. In Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams (pp. Xi-Xviii). SANTA MONICA, CA; WASHINGTON, DC; PITTSBURGH, PA; NEW ORLEANS, LA; JACKSON, MS; BOSTON, MA; CAMBRIDGE, UK; BRUSSELS, BE: RAND Corporation. Retrieved August 2, 2021, from http://www.jstor.org/stable/10.7249/j.ctt5vjvq3.6
CHICAGO
Yuan, Kun, and Vi-Nhuan Le. "Summary." In Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams, Xi-Xviii. SANTA MONICA, CA; WASHINGTON, DC; PITTSBURGH, PA; NEW ORLEANS, LA; JACKSON, MS; BOSTON, MA; CAMBRIDGE, UK; BRUSSELS, BE: RAND Corporation, 2014. Accessed August 2, 2021. http://www.jstor.org/stable/10.7249/j.ctt5vjvq3.6.

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